“…Therefore, in this project, we did not fully calculate the dephasing attributed to electron-phonon, electron-impurity and electron-alloy disorder scattering and that leads to measured s-shape-like features in dilute semiconductor samples (Imhof et al 2010;Kesaria et al 2015). The scattering processes cited above can all be described by selfenergies (Pereira 1995;Wacker 2002;Schmielau and Pereira 2009). Instead, we used Trust RegionReflective (TRR) methods (Hung 2012) to obtain the values of carrier density, homogeneous and inhomogenous broadening that best characterize experimental results and as a future step, we shall use these numbers to compare and contrast with Nonequilibrium Green's Functions (NEGF) calculations to help determine the relative influence of each scattering/dephasing mechanisms.…”