Nondestructive thickness measurement of silica scale using cathodoluminescence

Imashuku, Susumu; Hashimoto, Wataru; Wagatsuma, Kazuaki

doi:10.1016/j.saa.2020.119022

Cited by 11 publications

(1 citation statement)

References 27 publications

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“…The SEM-CL system has been described in detail in our previous papers. [28][29][30][32][33][34][35][36][37][38][39][40][41][42][43][44][45][46][47][48] In brief, the CL images were captured using a digital mirrorless camera (a7RII, Sony Corp., Tokyo, Japan) equipped with a zoom lens (LZH-10A-05T, Seimitu Wave Inc., Kyoto, Japan) via a quartz viewport attached to a SEM (Mighty-8DXL, TECHNEX, Tokyo, Japan). The detectable wavelength range of the camera was from 420 to 680 nm.…”

Section: Introductionmentioning

confidence: 99%

Identification of MgO·Al2O3 Spinel on MgO Refractory for Aluminum Deoxidation Process of Stainless Steel Using Cathodoluminescence and X-ray Excited Optical Luminescence Imaging

Imashuku

2021

Metall Mater Trans B

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MgOAEAl 2 O 3 spinel particles adhered to MgO refractory become a source of inclusions in stainless steel during the aluminum deoxidation process. In contrast, the MgOAEAl 2 O 3 spinel layer formed on MgO refractory can protect it from further dissolution and spalling. Thus, identifying the MgOAEAl 2 O 3 spinel particles and layer is critical for locating areas on the refractory that require repair and replacement. In this study, the author demonstrates that the MgOAEAl 2 O 3 spinel particles and layer on MgO refractory for aluminum deoxidation process of stainless steel are distinguishable from their luminescence colors in cathodoluminescence (CL) and X-ray excited optical luminescence (XEOL) images at wavelengths of 420 to 680 nm, 650 to 680 nm, and 350 to 1000 nm, respectively. The CL and XEOL images can be acquired within 2 seconds and 1 minutes, respectively. Surface examination of the MgO refractory aids in more precise identification. XEOL imaging, in particular, is promising because it can perform a nondestructive onsite evaluation of the MgO refractory.

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