2015
DOI: 10.1007/978-3-319-15588-3
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Noncontact Atomic Force Microscopy

Abstract: The series NanoScience and Technology is focused on the fascinating nano-world, mesoscopic physics, analysis with atomic resolution, nano and quantum-effect devices, nanomechanics and atomic-scale processes. All the basic aspects and technology-oriented developments in this emerging discipline are covered by comprehensive and timely books. The series constitutes a survey of the relevant special topics, which are presented by leading experts in the field. These books will appeal to researchers, engineers, and a… Show more

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Cited by 74 publications
(6 citation statements)
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“…A stiff qPlus cantilever design [49] (k 0 = 1800 N•m −1 , f 0 = 29077 Hz, Q = 60000) at an oscillation amplitude A osc = 50 pm enables the nc-AFM functionality. We calibrated the amplitude prior to the measurement atop the bare Cu(111) substrate [50]. The bias voltage V is applied to the substrate and the tunnelling current I is measured at the virtually grounded tip.…”
Section: Methodsmentioning
confidence: 99%
“…A stiff qPlus cantilever design [49] (k 0 = 1800 N•m −1 , f 0 = 29077 Hz, Q = 60000) at an oscillation amplitude A osc = 50 pm enables the nc-AFM functionality. We calibrated the amplitude prior to the measurement atop the bare Cu(111) substrate [50]. The bias voltage V is applied to the substrate and the tunnelling current I is measured at the virtually grounded tip.…”
Section: Methodsmentioning
confidence: 99%
“…(5) (6) where α i = {1.8750, 4.6941, 7.8548, … } are coefficients defined by the characteristic equation of an oscillating rectangular cantilever with one free end [60]. Note that for a typical non-contact AFM experiment, the tip end of the cantilever can be considered as free because the cantilever force constant is generally much smaller than the measured derivative of the tip-sample interaction force [61]. The force constant of a rectangular cantilever and its first flexural mode stiffness, respectively, are given by: (7) where ρ Si = 2331 kg/m 3 and E Si = 1.69 × 10 11 N/m 2 are the density and the elastic modulus of silicon, respectively; L, w, and t are the length, width, and thickness of the cantilever, respectively.…”
Section: Performance Of the Spm Relevant Afm Noise Sourcesmentioning
confidence: 99%
“…Commercial AFMs mostly use proportional-integral (PI) or proportional-integral-derivative (PID)-type controllers. 1,29,39 To assess the performance of the proposed I&I controller in comparison with the classic control methods, we conducted comparative simulation using a PID controller of the form…”
Section: Comparison With Pid Controlmentioning
confidence: 99%
“…Since the AFM tip in tapping mode is under attractive nonlinear force, behavioral instability and chaos may occur in the tapping mode near the sample. 1 This instability creates hysteresis and jump phenomenon in the system, which causes some errors in the test results. 2 Chaos is commonly found in nonlinear dynamical systems, which is calamitous and can cause fatigue or damage to the system.…”
mentioning
confidence: 99%