2020
DOI: 10.1364/oe.381523
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Non-uniformity correction for medium wave infrared focal plane array-based compressive imaging

Abstract: As a super-resolution imaging method, high-resolution medium wave infrared (MWIR) images can be obtained from a low-resolution focal plane array-based (FPA) sensor using compressive imaging (CI) technology. As a common problem in MWIR FPA imaging, the non-uniformity reduces image quality, which is turning worse in MWIR FPA CI. This paper investigates the source of the non-uniformity of MWIR FPA CI, both in the captured low-resolution MWIR images and in the reconstructed high-resolution ones. According to the s… Show more

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Cited by 14 publications
(7 citation statements)
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“…In Equation (1), if an infrared image containing stripe noise is input into X, it will be discovered through experiments that the stripe noise can be decomposed into an XZ lowrank component by LatLRR. The XZ part primarily contains the low-frequency component of the image, which reflects the main body of the original image after LatLRR decomposition.…”
Section: Experimental Verification and Analysismentioning
confidence: 99%
“…In Equation (1), if an infrared image containing stripe noise is input into X, it will be discovered through experiments that the stripe noise can be decomposed into an XZ lowrank component by LatLRR. The XZ part primarily contains the low-frequency component of the image, which reflects the main body of the original image after LatLRR decomposition.…”
Section: Experimental Verification and Analysismentioning
confidence: 99%
“…As the spectrum region between 3 µm and 5 µm, medium wave infrared (MWIR) has a number of important characteristics beyond the visible light leading to many applications, such as environmental monitoring, astronomical observation, and military target spying. 1,2 As four basic parameters of light, polarization can enrich the targets scattering information of surface topography and roughness. 3 In polarimetric imaging field, it can enhance target background contrast and object recognition.…”
Section: Introductionmentioning
confidence: 99%
“…Infrared detectors are often subject to severe non-uniform noise due to factors such as semiconductor materials, fabrication processes, readout circuits, and amplifier circuits [4,5]. Non-uniform noise seriously affects the imaging quality of the system, reduces the system resolution and the point target Signal-to-Noise Ratio (SNR), which is the bottleneck restricting the infrared point target detection system to reach the background limit [6,7].…”
Section: Introductionmentioning
confidence: 99%