2016
DOI: 10.1107/s1600577515023528
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Non-negative matrix factorization for the near real-time interpretation of absorption effects in elemental distribution images acquired by X-ray fluorescence imaging

Abstract: Elemental distribution images acquired by imaging X-ray fluorescence analysis can contain high degrees of redundancy and weakly discernible correlations. In this article near real-time non-negative matrix factorization (NMF) is described for the analysis of a number of data sets acquired from samples of a bi-modal α+β Ti-6Al-6V-2Sn alloy. NMF was used for the first time to reveal absorption artefacts in the elemental distribution images of the samples, where two phases of the alloy, namely α and β, were in sup… Show more

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Cited by 19 publications
(4 citation statements)
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“…In particular, given the non‐negative nature of counts in the X‐ray spectra, the non‐negative matrix analysis (NNMA) has been carried out, resulting in a set of new XRF spectra and a corresponding set of new XRF images [25–27] …”
Section: Resultsmentioning
confidence: 99%
“…In particular, given the non‐negative nature of counts in the X‐ray spectra, the non‐negative matrix analysis (NNMA) has been carried out, resulting in a set of new XRF spectra and a corresponding set of new XRF images [25–27] …”
Section: Resultsmentioning
confidence: 99%
“…For the purpose, the hyperspectral datacube is rearranged in a data matrix D ∈ R d×n made of n pixels, while d is the spectral dimension. The data matrix is then factorized as the product of k spectral endmembers represented by the matrix W ∈ R d×k and the abundance matrix H ∈ R k×n , which represents the contribution of each endmember to a given pixel [30]. The process is summarized as follows:…”
Section: Data Post-processing and Analysismentioning
confidence: 99%
“…EDS could perform element analysis by measuring the energy of the excited X-ray photons of solid materials, for samples with less complex element distribution, this measure was efficient and stable. Besides, X-ray fluorescence analysis and X-ray photoelectron spectroscopy were also frequently applied for elemental analysis [35]. The EDS spectrum in Figure 2 represented the fluctuation of element content.…”
Section: Microstructure Characterizationmentioning
confidence: 99%