2013
DOI: 10.1016/j.apsusc.2012.10.174
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Non-linear absorption of focused femtosecond laser pulses at 1.3μm inside silicon: Independence on doping concentration

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Cited by 23 publications
(24 citation statements)
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“…This assumes that only two-photon absorption contributes to nonlinear ionization which is consistent with the absence of avalanche signatures for similar experimental conditions. 16 Using a two-photon absorption coefficient 6,23,33 in the range of 0.5-1.5 cm/GW, we find a maximum free-carrier density N max ¼ ½2:9 À 8:1 Â 10 19 cm À3 which is in remarkable agreement with our previous measurements based on ultrafast imaging of the plasma. 5 Assuming that all the absorbed energy to create the plasma is transferred to the lattice, the material can suffer a corresponding energy density E abs ¼ 2 hxN max in the range of 8.8-16.8 J/cm 3 , which is far below the energy density of % 6 kJ cm À3 required to heat silicon to the melting point and overcome the latent heat.…”
Section: à2supporting
confidence: 80%
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“…This assumes that only two-photon absorption contributes to nonlinear ionization which is consistent with the absence of avalanche signatures for similar experimental conditions. 16 Using a two-photon absorption coefficient 6,23,33 in the range of 0.5-1.5 cm/GW, we find a maximum free-carrier density N max ¼ ½2:9 À 8:1 Â 10 19 cm À3 which is in remarkable agreement with our previous measurements based on ultrafast imaging of the plasma. 5 Assuming that all the absorbed energy to create the plasma is transferred to the lattice, the material can suffer a corresponding energy density E abs ¼ 2 hxN max in the range of 8.8-16.8 J/cm 3 , which is far below the energy density of % 6 kJ cm À3 required to heat silicon to the melting point and overcome the latent heat.…”
Section: à2supporting
confidence: 80%
“…All tested silicon substrates are 100-orientation, high-resistivity crystals (intrinsic or n-doped substrates with R > 10 X cm) so that all are fully transparent to the laser wavelength and we avoid any avalanche effects from equilibrium carrier concentration. 16 Cross-sectioning of the substrates is performed to observe the damage in the bulk of materials. However, because it would be very challenging to cut a substrate in the middle of a micro-sized region, we decided to apply a conventional scanning procedure to produce extended modifications by translating the sample using a motorized X-Y micropositioning stages at 0.1 mm/s perpendicular to the propagation direction of the laser beam (see inset in Fig.…”
Section: Experimental Setup and Methodsmentioning
confidence: 99%
“…The use of mid-infrared wavelengths is required to develop 3D applications in in narrow gap semiconductors. In previous works, we have shown the non-linear response of Si silicon was independent on the doping concentration at 1.3µm [13]. Here, we have shown the response must be also independent on the wavelength.…”
Section: Discussionmentioning
confidence: 77%
“…It is about 100 times less in Si (~50kW) than in SiO 2 . While our previous diagnostics [5,13] and simulations [14] did not exhibit any clear signature of self-focusing, we work here with typical MW power beams and it is likely non-linear propagation effects play roles in Si. In SiO 2 , we can reach the intensities required for multiphoton-avalanche ionization without exceeding the power threshold for self-focusing (~15MW).…”
Section: Measurements and Discussionmentioning
confidence: 93%
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