2014
DOI: 10.1039/c4nr01918k
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Non-invasive transmission electron microscopy of vacancy defects in graphene produced by ion irradiation

Abstract: Irradiation with high-energy ions has been widely suggested as a tool to engineer properties of graphene. Experiments show that it indeed has a strong effect on graphene's transport, magnetic and mechanical characteristics. However, to use ion irradiation as an engineering tool requires understanding of the type and detailed characteristics of the produced defects which is still lacking, as the use of high-resolution transmission microscopy (HRTEM) -the only technique allowing direct imaging of atomic-scale de… Show more

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Cited by 53 publications
(31 citation statements)
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References 55 publications
(128 reference statements)
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“…Notice that MD simulations exclusively find single vacancies after Ar + bombardment at 50 eV of monolayer graphene [68] and again that the TEM data imply that the single vacancies are immobile [58]. Indeed, the defects exhibit a peak in dI/dV spectroscopy exclusively around E F up to ion fluences of 1/(nm 2 ) as expected for single vacancies [ Fig.…”
Section: Stm Results On Graphenementioning
confidence: 92%
“…Notice that MD simulations exclusively find single vacancies after Ar + bombardment at 50 eV of monolayer graphene [68] and again that the TEM data imply that the single vacancies are immobile [58]. Indeed, the defects exhibit a peak in dI/dV spectroscopy exclusively around E F up to ion fluences of 1/(nm 2 ) as expected for single vacancies [ Fig.…”
Section: Stm Results On Graphenementioning
confidence: 92%
“…The strain is relaxed by formation of structural defects, and morphology of these defects is strongly dependent on growth kinetics . Planar surface defects and vacancy defects exhibit Moire fringes . Existence of defects in the form of vacancy defects, fault zones, and misfit dislocations is visibly marked by white arrows (Figure D,E) .…”
Section: Resultsmentioning
confidence: 99%
“…Modern electron microscopes with aberration-corrected condensers allow focusing an electron beam onto a spot of approximately 1 Å in diameter thereby creating vacancies with almost atomic selectivity [30] . Another physical method which has been used for defect production in graphene is ion irradiation [31][32][33][34][35] . It can be used to selectively produce certain defects or to pattern and cut graphene with a precision down to 10 nm utilizing a focused ion [36,37] .…”
Section: Particle Irradiationmentioning
confidence: 99%