Non-contact measuring method for high-frequency impedance of load at the end of wire harness

Yoshikawa, Tsuneo; Wang, Jianqing; Yasunori, Oguri; Tanaka, Makoto; Iida, Michihira

doi:10.1109/emc-b.2017.8260447

2017 IEEE 5th International Symposium on Electromagnetic Compatibility (EMC-Beijing) 2017

DOI: 10.1109/emc-b.2017.8260447

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Non-contact measuring method for high-frequency impedance of load at the end of wire harness

Tsuneo Yoshikawa

Jianqing Wang

Oguri Yasunori

et al.

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Methodology for Extracting Low-Frequency Input Impedance of Personal Computer During Operation Using Dual Current Probes Method

Rhee,

Kim,

Chu

et al. 2024

IEEE Trans. Electromagn. Compat.

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Methodology for Extracting Low-Frequency Input Impedance of Personal Computer During Operation Using Dual Current Probes Method

Rhee,

Kim,

Chu

et al. 2024

IEEE Trans. Electromagn. Compat.

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Non-contact measuring method for high-frequency impedance of load at the end of wire harness

Cited by 1 publication

References 4 publications

Methodology for Extracting Low-Frequency Input Impedance of Personal Computer During Operation Using Dual Current Probes Method

Methodology for Extracting Low-Frequency Input Impedance of Personal Computer During Operation Using Dual Current Probes Method

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