2017 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS) 2017
DOI: 10.1109/comcas.2017.8244768
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Noise modeling of transferred-substrate InP-DHBTs

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Cited by 2 publications
(2 citation statements)
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“…For the transferred-substrate DHBT technology used in this work, noise parameters were measured up to 26 GHz in order to investigate the noise properties, especially regarding τ n . It was found that τ n close to the base-collector transit time yields lower minimum NFs toward higher frequencies compared with the approximation ωτ n ≈ 0 which is predicting a steeper slope [23].…”
Section: Noise Modelingmentioning
confidence: 99%
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“…For the transferred-substrate DHBT technology used in this work, noise parameters were measured up to 26 GHz in order to investigate the noise properties, especially regarding τ n . It was found that τ n close to the base-collector transit time yields lower minimum NFs toward higher frequencies compared with the approximation ωτ n ≈ 0 which is predicting a steeper slope [23].…”
Section: Noise Modelingmentioning
confidence: 99%
“…In the course of this work, 50-Ω NF (NF 50 ) was measured in the frequency range of 75–105 GHz in order to validate the model's extrapolation capability. Figure 5 shows the measurement together with NF 50 s calculated from the measured noise parameters up to 26 GHz reported in [23] (bullets) compared with simulated values (lines). The device under test was a single-finger transfer-substrate InP DHBTs with an emitter area of 0.8 × 6 µm 2 measured at the same bias points as used in the design of the circuit.…”
Section: Noise Modelingmentioning
confidence: 99%