1998
DOI: 10.1016/s0040-6090(98)00369-1
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Noise, bolometric performance and aging of thin high Tc superconducting films on silicon membranes

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Cited by 11 publications
(7 citation statements)
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“…The frequency dependence is in agreement with experimental findings. 3,7 The somewhat lower D I * values observed in these simulations at low f are due to larger contributions of flicker (1/f ) noise of this device, since different resistance values and associated noise Hooge coefficients have been used. Most pronounced, under CVM condition, a nearly two orders of magnitude extended frequency span up to 10 5 Hz has been obtained.…”
Section: ͓S0003-6951͑00͒03705-0͔mentioning
confidence: 88%
See 1 more Smart Citation
“…The frequency dependence is in agreement with experimental findings. 3,7 The somewhat lower D I * values observed in these simulations at low f are due to larger contributions of flicker (1/f ) noise of this device, since different resistance values and associated noise Hooge coefficients have been used. Most pronounced, under CVM condition, a nearly two orders of magnitude extended frequency span up to 10 5 Hz has been obtained.…”
Section: ͓S0003-6951͑00͒03705-0͔mentioning
confidence: 88%
“…Experimentally determined parameters of the superconducting film have been used. 8,7 The influence of operating temperature and biasing conditions on the bolometer performance for CCM and CVM operation is illustrated in Figs. 1 and 2.…”
Section: ͓S0003-6951͑00͒03705-0͔mentioning
confidence: 99%
“…No specific optimization in order to reduce the excess noise in our YBCO films was made, which explains why the noise level is rather large, if compared to other works17,19 . As shown by Neff et al17 , the use of a thin gold layer onto the YBCO layer can lead to very low noise equivalent temperature at 10 Hz. The use of such levels in our model would have lead to dramatic reduction of the noise floor of the sample holder, which means improvements in the ESR performances.…”
mentioning
confidence: 93%
“…Choosing P in,MAX = 10 mW, V REF = 10 V, S = 100 V K −1 gives G ESR = 100 mW K −1 . Such a thermal conductance value can reasonably be achieved at 90 K using silicon micromachining techniques16,17 : for calculations we assumed a 10 − 30 µm thick membrane of 3 × 3 mm 2 area. It follows that the noise associated with that of the heat sink should be G ESR × T n (10 Hz) of the order of 10 −8 W Hz −1/2 , i.e., a standard deviation of the order 800 pW ef f with a measuring time of 250 s. To estimate the noise associated with that of the receiver thermometer we need to know the receiver time constant.…”
mentioning
confidence: 99%
“…This work is focused on the changes produced by the electrothermal feedback on thermal noise and flicker noise, with particular emphasis on the former. Therefore, analysis of phonon noise is out of the scope of this paper, although its contribution can be dominant in the case of materials with particularly high TCRs [17].…”
Section: Introductionmentioning
confidence: 99%