The recent development of codrawn metal-insulator-semiconductor photodetecting fiber devices with mesoscopic-scale cross-sectional features has heralded a novel path to optical radiation detection. [1][2][3][4][5][6][7][8] For the first time, optical detection function may be delivered at length scales and in a mechanically flexible form hitherto associated with optical fibers. At the heart of the fabrication process is the simultaneous reduction of the cross-section and extension of the axial dimensions of a macroscopic prefrom. Thermal drawing results in extended length scales of functional fiber while maintaining the material composition and transverse geometry throughout. Although beneficial for many applications, [1,2,5,6] the extended length scales of fiber-devices tend to degrade their performance by raising the noise floor. Our study aims to minimize the noise per unit length by identifying optimal fiber structures and geometries. A comparative study of the responsivity, noise and sensitivity [9,10] of photodetecting fibers as a function of structural and geometric scaling parameters is performed. A novel thin-film photodetecting fiber device architecture is introduced. Precise control over the submicron scale dimensions affords more than an order of magnitude increase in the fiber-device sensitivity. Potential applications of fiber devices include remote sensing, functional fabrics, and largearea, two-dimensional (2D) and three-dimensional (3D) arrays (or "fiber webs") capable of optical imaging. [1,5,6]