No-Reference Quality Assessment Method of Evaluating Scanning Electron Microscopy Images Based on Multi-Scale Characteristics

Qiaoyue, 李巧月 Li; Gangcheng, 商钢城 Shang; Qiang, 田强 Tian; Xi, 陈曦 Chen; Xixi, 韩习习 Han; Yu, 周玉 Zhou; Leida, 李雷达 Li

doi:10.3788/lop55.111005

激光与光电子学进展

2018

DOI: 10.3788/lop55.111005

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No-Reference Quality Assessment Method of Evaluating Scanning Electron Microscopy Images Based on Multi-Scale Characteristics

李巧月 Li Qiaoyue¹,

商钢城 Shang Gangcheng²,

田强 Tian Qiang³

et al.

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No-Reference Quality Assessment Method of Evaluating Scanning Electron Microscopy Images Based on Multi-Scale Characteristics

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