2011
DOI: 10.1016/j.jcrysgro.2011.09.036
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Nitrogen reaction with silicon: Investigation of Si undercooling and Si3N4 growth

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Cited by 10 publications
(5 citation statements)
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“…electromagnetic levitation set-up has been developed in order to measure these thermo-physical properties [19]. It is found that the Si undercooling is a function of C concentration [20,21]. -The law used for spherical Si grain growth is a simplified approximation of the model published for the case of parabolic thermal metallic dendrites.…”
Section: Suggested Improvement For the Modelmentioning
confidence: 99%
“…electromagnetic levitation set-up has been developed in order to measure these thermo-physical properties [19]. It is found that the Si undercooling is a function of C concentration [20,21]. -The law used for spherical Si grain growth is a simplified approximation of the model published for the case of parabolic thermal metallic dendrites.…”
Section: Suggested Improvement For the Modelmentioning
confidence: 99%
“…The conclusion was that the nucleation of equiaxed silicon grains during growth was triggered by Si 3 N 4 particles rather than SiC [7]. It should be kept in mind, however, that the experiments by Beaudhuin et al [6,7] were levitation drop experiments without any crucible or other solid substrates present. The source of carbon leading to nucleation can be either the furnace or the silicon feedstock.…”
Section: Introductionmentioning
confidence: 98%
“…Si 3 N 4 particles can, again, form due to the dissolution and re-precipitation of nitrogen from the Si 3 N 4 coating or the furnace atmosphere [4]. Beaudhuin et al [6] showed that the nucleation undercooling decreased from 300 K for pure silicon to 1 K for silicon with a nitrogen concentration of 600 ppmw. With carbon as the main impurity, the nucleation undercooling went from 300 K, for pure silicon, to a few Kelvin with increasing impurity concentration.…”
Section: Introductionmentioning
confidence: 99%
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“…In bibliography there are some research works dealing with undercooling measurements in an electromagnetic levitation setup either concerning pure silicon or silicon containing a controlled percentage of impurities. Those kinds of experiments give information about the role that the presence of nucleation centers, inside the droplet, has on the final microstructure of silicon but do not take under consideration the role that the substrate (crucible or mould walls) plays on the nucleation of silicon .…”
Section: Introductionmentioning
confidence: 99%