2015
DOI: 10.1117/12.2078317
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Nitride heterostructure influence on efficiency droop

Abstract: The influence of nitride heterostructures on efficiency droop is presented. It was developed a special method based on simulation for investigating the changes in the semiconductor devices characteristics due to different influencing factors. The cause of efficiency droop was detected -large difference in carrier lifetimes. The simulation results are used to suggest several ways for improving LED efficiency about 12 %.

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Cited by 2 publications
(1 citation statement)
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“…based on different materials: Si, Ge, A III B V , A II B VI and etc. ; 3) the device simulation possibility with the structures containing plenty of layers including layers with quantum-mechanical properties (single and multiple quantum wells) [1][2][3][4][5]. The program has an exclusive flexibility at optoelectronic semiconductor device simulation.…”
Section: Introductionmentioning
confidence: 99%
“…based on different materials: Si, Ge, A III B V , A II B VI and etc. ; 3) the device simulation possibility with the structures containing plenty of layers including layers with quantum-mechanical properties (single and multiple quantum wells) [1][2][3][4][5]. The program has an exclusive flexibility at optoelectronic semiconductor device simulation.…”
Section: Introductionmentioning
confidence: 99%