2006
DOI: 10.1080/19315775.2006.11721320
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NIST Calibration Uncertainties of Thermistor Thermometers over the Range from −50 °C to 90 °C

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Cited by 6 publications
(6 citation statements)
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“…The temperature of various components of the system is monitored by six W 10 k thermistors, monitored with a Hart/Fluke BlackStack system, and calibrated in the NIST temperature calibration facility [21] to   0.002 C. These thermistors are The NIST x-ray diffraction goniometer system, in its  0.01 C temperature-regulated space. The control room is through the window visible at the back.…”
Section: Temperature Monitoring and Thermal Designmentioning
confidence: 99%
“…The temperature of various components of the system is monitored by six W 10 k thermistors, monitored with a Hart/Fluke BlackStack system, and calibrated in the NIST temperature calibration facility [21] to   0.002 C. These thermistors are The NIST x-ray diffraction goniometer system, in its  0.01 C temperature-regulated space. The control room is through the window visible at the back.…”
Section: Temperature Monitoring and Thermal Designmentioning
confidence: 99%
“…After about year 2000, NIST calibration and testing of LiG thermometers utilized a computer-driven digital camera and 10× magnification to visualize the meniscus of the liquid column [100,103]. System resolution was 1/34 of the smallest stem division, equivalent to ±0.03 • C for a 1 • C/division LiG thermometer.…”
Section: Resultsmentioning
confidence: 99%
“…The data were collected from 18°2 θ to 155°2 θ . The machine was located within a temperature-controlled laboratory space where the nominal short-range control of temperature was ±0.1 K. The temperature was monitored using two 10 kΩ thermistors with a Hart/Fluke BlackStack system that was calibrated at the NIST temperature calibration facility (Vaughn and Strouse, 2001) to ±0.002 K. The source was equilibrated at operating conditions for at least an hour prior to recording any certification data. The performance of the machine was qualified with the use of NIST SRM 660b (SRM 660b, 2010; Black et al , 2011) and SRM 676a using procedures discussed by Cline et al (2015).…”
Section: Methodsmentioning
confidence: 99%