2017
DOI: 10.1039/c7ta01593c
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Nickel oxide nanoparticles for efficient hole transport in p-i-n and n-i-p perovskite solar cells

Abstract: Here, a low-temperature solution-processed nickel oxide (NiOx) thin film was first employed as a hole transport layer in both inverted (p-i-n) planar and regular (n-i-p) mesoscopic organic–inorganic hybrid perovskite solar cells (PVSCs).

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Cited by 201 publications
(136 citation statements)
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“…[16a] As shown in the energy diagram of Figure 1a, the energy level of PEDOT:PSS is well aligned with spiro-OMeTAD for efficient charge extraction. [8,17] The as-resulted absorber layer of CH 3 NH 3 PbI 3 (Cl) has been shown to improve carrier transport across the heterojunction interfaces. Cross-sectional SEM images of Device A and Device C are shown in Figure S2 (Supporting Information).…”
Section: Resultsmentioning
confidence: 99%
“…[16a] As shown in the energy diagram of Figure 1a, the energy level of PEDOT:PSS is well aligned with spiro-OMeTAD for efficient charge extraction. [8,17] The as-resulted absorber layer of CH 3 NH 3 PbI 3 (Cl) has been shown to improve carrier transport across the heterojunction interfaces. Cross-sectional SEM images of Device A and Device C are shown in Figure S2 (Supporting Information).…”
Section: Resultsmentioning
confidence: 99%
“…[10] After thermal selenization process, new XRD peaks emerge accompanied with the complete disappearance of the typical NiCH and NiFe-PBA peaks, suggesting complete transformation of the NiFe-PBA@NiCH@CC into a new crystal phase. [12] The same diffraction peaks are also detected in the XRD pattern of the NiSe|O@CC, which suggests the formation of the oxide phase mostly in the support carbonate hydroxide derived selenide structure. [11] Slight peak shift and peak intensity change are observed in the XRD pattern of NiFeSe@NiSe|O@CC compared to that of NiSe|O@CC prepared by direct selenization of NiCH@CC ( Figure S13, Supporting Information).…”
Section: Resultsmentioning
confidence: 55%
“…[164] Allerdings wird Perowskit durch tBP korrodiert und durch feuchtigkeitsempfindliches TFSI abgebaut. [132] Einige stabile Lochtransportmaterialien, die bei niedrigen Te mperaturen hergestellt werden, wie NiO,C uI und Poly(3-hexylthiophen) (P3HT), [167][168][169][170] wurden als Ersatz fürd ie häufig verwendeten HTLs entwickelt. [132] Einige stabile Lochtransportmaterialien, die bei niedrigen Te mperaturen hergestellt werden, wie NiO,C uI und Poly(3-hexylthiophen) (P3HT), [167][168][169][170] wurden als Ersatz fürd ie häufig verwendeten HTLs entwickelt.…”
Section: Ito-freiunclassified