New version of SNAP simulator

Kolka, Zdenek; Biolková, Viera; Biolek, Dalibor

doi:10.23919/kit.2017.8109440

Cited by 4 publications

(1 citation statement)

References 6 publications

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“…The most affecting small-signal parasitic features are concentrated to high-impedance nodes (see passive elements highlighted in magenta color in Figure 2 ). These analyses were performed with the help of the simplification mode of symbolical solver SNAP [ 34 ]. The visible resonant frequency peak is defined by both parasitic capacities of high-impedance nodes C p1 and C p2 :

thus, this value varies with A .…”

Section: Simulation and Experimental Resultsmentioning

confidence: 99%

Electronic Tunability and Cancellation of Serial Losses in Wire Coils

Šotner

Jeřábek

Polák

et al. 2022

Sensors

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This work presents a novel methodology to adjust the inductance of real coils (electronically) and to cancel out serial losses (up to tens or even hundreds of Ohms in practice) electronically. This is important in various fields of electromagnetic sensors (inductive sensors), energy harvesting, measurement and especially in the instrumentation of various devices. State-of-the-art methods do not solve the problem of cancellation of real serial resistance, which is the most important parasitic feature in low- and middle-frequency bands. In this case, the employment of serial negative resistance is not possible due to stability issues. To solve this issue, two solutions allowing the cancellation of serial resistance by the value of the passive element and an electronically adjustable parameter are introduced. The operational ranges are between 0.1 and 1 mH and 0.1 and 10 mH, valid in bandwidths from hundreds of Hz up to hundreds of kHz. The proposed concepts are experimentally tested in two applications: an electronically tunable oscillator of LC type and an electronically tunable band-pass RLC filter. The presented methodology offers significant improvements in the process of circuit design employing inductors and can be beneficially used for on-chip design, where serial resistance issues can be very significant.

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thus, this value varies with A .…”

Section: Simulation and Experimental Resultsmentioning

confidence: 99%