disorder at the local scale. It would be appropriate to name the structure a highly defected single crystal.Due to the above, it is difficult to choose mathematical tools for its analysis. None of the existing tools are obvious and it is difficult to make a choice which would be undisputable. This is already highlighted in the previous paper. [1] As was described in the original article, molecular dynamics simulations of a system containing at least 42 PANI chains of seven monomers each, bound to themselves through the sides of the simulation box (periodic boundary conditions are applied) and doped with (at least, in accordance with the number of chains in the simulation) 294 CSA counter ions were performed. The entire simulation procedure included relaxation at the temperature of 300 K for 500 ps, simulation at 300 K with the constant pressure of 1000 hPa for 300 ps for the structure to reach its equilibrium, and a final 200 ps long simulation in this state for quantitative calculations. The several initial arrangements evolve into a stable form, qualitatively identical for different starting In a recent paper, a new structural model of polyaniline (PANI) doped with camphorsulfonic acid (CSA) obtained by molecular dynamics simulations is proposed. This model is characterized by double layers of PANI separated by double layers of CSA. Here some new evidences for the correctness of the new model are shown, drawn from the comparison of its calculated diffraction patterns with experimental data. First, the powder diffraction patterns are calculated from the Debye formula and by a custom algorithm. This makes it possible to describe the anisotropy of all diffraction peaks by giving their pole figures. The orientations of all crystal planes and their indexations (obtained independently from the average orthorhombic unit cell proposed for the model structure) are consistent, and this description agrees well with already published results of experimental study of PANI/CSA thin films performed with the use of synchrotron radiation surface diffraction technique.