New sensors for dental X-ray imaging

Fröjdh, Christer; Andersson, Jan Y.; Bates, R. L.; Heuken, M.; Irsigler, R.; Petersson, C. S.; O’Shea, V.; Stamatakis, Harry; Welander, Ulf

doi:10.1016/s0168-9002(99)00423-4

Cited by 13 publications

(4 citation statements)

References 13 publications

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“…However, the above imagers are expensive and so highly dependent on the manufacturing facility that it is not easy to access the fabrication methods. Because of advantages of the complementary-metal-oxide semiconductor active pixel sensor (CMOS APS) imager [4], a scintillator coupled CMOS APS (SC CMOS APS) imager is used as one of approaches for digital X-ray imaging [5]. Although the CMOS APS imager has a relatively small field of view right now, it may challenge the large FPI by using the bigger Si wafer than the present wafer size and tiling or mosaic methods [6] of a small flat panel.…”

Section: Introductionmentioning

confidence: 99%

Scintillator and CMOS APS Imager for Radiography Conditions

Kim

2008

IEEE Trans. Nucl. Sci.

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We evaluated X-ray image performance for several scintillators and a CMOS APS imager by both diagnostic radiography and mammography conditions. Commercially available scintillators such as Lanex screen, needle structured CsI (Tl), and fiber optic structured CsI (Tl) were coupled with a CMOS APS imager. The X-ray machines used in this study were fixed tube voltage of 80 kVp and variable tube current over 0.33 mA using LISTEM™ for diagnostic radiography, and fixed tube voltage of 28 kVp and variable tube current over 16 mA using Alpha-ST™ for mammography. We used the RadEye1™ CMOS APS imager having an active area of 25 mm by 50 mm with the pixel size of 48 m.

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Section: Introductionmentioning

confidence: 99%

Scintillator and CMOS APS Imager for Radiography Conditions

Kim

2008

IEEE Trans. Nucl. Sci.

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“…High signal-to-noise ratio, fast reaction rate, high spatial resolution, enough good energy resolution, relatively low cost and mature fabrication technology give to semiconductor detectors a real advantage in comparison with the main competitor: the photodiode coupled to a scintillator crystal (see e.g. 10 ). For now bulk SI GaAs has been identified as one of the most interesting semiconductor materials for the fabrication of low cost, fast radiation detectors operated at RT to be used in X-ray digital imaging ( 11 and references therein), especially in the medical field.…”

Section: Introductionmentioning

confidence: 99%

Study of radiation detectors based on semi-insulating GaAs and InP: aspects of material and electrode technology

Dubecký¹,

Nečas

2007

SPIE Proceedings

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In this work, the most important aspects of semi-insulating (SI) GaAs and SI InP-based radiation detectors will be listed. Based on that, the material and technology requirements will be identified. Further, the status of development of X-and gamma-ray detectors based on the bulk SI GaAs and SI InP will be reviewed. The emphasis will be concentrated on the following important aspects: (i) basic material characteristics, (ii) role of the electrodes (blocking contacts, ohmic contacts) in the overall performances of detectors. The fabrication technology and the performances of detectors and their application in the first quantum X-ray digital scanner recently developed will also be illustrated along with some conclusions about the material/application relations: (i) radiation detectors based on bulk SI GaAs may readily find applications in X-ray digital radiology imaging systems, whilst (ii) SI InP-based detectors are very promising but need further development to reach performances suitable for the application.

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“…A challenging technological refinement to single-photon counting detectors consists of implementing an energy discrimination stage in the sensor for the recording of spectrometric information in addition to two-dimensional x-ray position information. 18,24,[27][28][29] This opens new perspectives in the field of energy-sensitive ͑or "color"͒ x-ray imaging, allowing the energy weighting function of the system to be tuned by the imaging software to the requirements of a broad-spectrum imaging task, independently of the detection mechanisms occurring in the sensor. Such sensor architecture will produce "optimal" detectors in the sense proposed by Tapiovaara and Wagner.…”

Section: Introductionmentioning

confidence: 99%

Extension of x‐ray imaging linear systems analysis to detectors with energy discrimination capability

Marchal

2005

Medical Physics

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A figure of merit, the broad-spectrum generalized detective quantum efficiency, which describes the performance of digital detectors designed for broad-spectrum x-ray imaging is derived from linear response theory. This measure of the imaging efficacy of an x-ray sensor is obtained when detector contrast modulation in the domain of x-ray energy is introduced in the Fourier-based analysis of digital systems. A method is proposed to scale existing figures of merit according to the energy-dependent response of the detector and the spectral shape of the x-ray beam. The new figure of merit obtained with this method provides an extended description of system performance when comparing energy-integrating, single-photon counting, and future energy-sensitive x-ray imaging sensors. The applicability of this linear system analysis is restricted to the tasks of low-contrast object detection in radiography. The method for scaling the figure of merit to take into consideration broad-spectrum conditions is applied to mammography for future energy-dependent detectors. An approximation valid in the typical mammographic x-ray energy range is used to calculate the broad-spectrum generalized detective quantum efficiency at zero spatial frequency, for several mammographic x-ray spectra. X-ray energy weighting in mammography is investigated in the context of simulated tumors and microcalcifications detection by comparing this figure of merit, calculated for different detector technologies, under ideal imaging conditions, at zero spatial frequency.

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New sensors for dental X-ray imaging

Cited by 13 publications

References 13 publications

Scintillator and CMOS APS Imager for Radiography Conditions

Scintillator and CMOS APS Imager for Radiography Conditions

Study of radiation detectors based on semi-insulating GaAs and InP: aspects of material and electrode technology

Extension of x‐ray imaging linear systems analysis to detectors with energy discrimination capability

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