New Scopes of Materials Research Through Electron Microscopy-Lattice Defects and Microstructures in Advanced Semiconductors and Ceramics

禎彦, 弘津; 惣明, 大貫; 清眞, 仲井; 達雄, 里; 稔, 西田

doi:10.2320/materia.37.979

Materia Japan

1998

DOI: 10.2320/materia.37.979

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New Scopes of Materials Research Through Electron Microscopy-Lattice Defects and Microstructures in Advanced Semiconductors and Ceramics

弘津禎彦¹,

大貫惣明²,

仲井清眞³

et al.

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New Scopes of Materials Research Through Electron Microscopy-Lattice Defects and Microstructures in Advanced Semiconductors and Ceramics

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