New Scatterometer for Spatial Distribution Measurements of Light Scattering from Materials

Kawate, Etsuo; Hain, Miroslav

doi:10.2478/v10048-012-0012-y

Cited by 8 publications

(4 citation statements)

References 4 publications

(7 reference statements)

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“…-3 mol/L, 1.0×10 -2 mol/L) as the samples for the experiment were driving to the four channels, respectively, by the high voltage. [21][22]. While the sample moves to the detection point, the laser excites the fluorescence which is received by the CCD detection system.…”

Section: Host Applicationsmentioning

confidence: 99%

Signal Detection of Multi-Channel Capillary Electrophoresis Chip Based on CCD

Lv¹,

Wang

Yang³

et al. 2012

Measurement Science Review

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A kind of multi-channel capillary electrophoresis (CE) chip signal detection system based on CCD was developed. The output signal of the CCD sensor was processed by a series of pre-processing circuits and ADC, and then it was collected by the Field Programmable Gate Array (FPGA) chip which communicated with a host computer. The core in FPGA was designed to control the signal flow of the CCD and transfer the data to PC based on a Nios II embedded soft-processor. The application of PC was used to store the data and demonstrate the curve. The measurement of the fluorescent signals for different concentration Rhodamine B dyes is presented and the comparison with other detection systems is also discussed.

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Section: Host Applicationsmentioning

confidence: 99%

Signal Detection of Multi-Channel Capillary Electrophoresis Chip Based on CCD

Lv¹,

Wang

Yang³

et al. 2012

Measurement Science Review

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“…This combination resolves the issue of a single, mobile detector in the gonioreflectometer, since in the case of IS the information is obtained simultaneously for each of the millions of camera pixels. As a first, the IS method was applied for determining the BSDF in the Parousiameter device patented by Philips [14]. The implementation of this patent was carried out by Radiant Imaging (Radiant Zemax from 2012); they constructed the commercial scatterometer IS-SA (Imaging Sphere for Scatter and Appearance measurements) device [15].…”

Section: Introductionmentioning

confidence: 99%

Imaging Scatterometry with Extrapolation of Missing BRDF Data for Materials Used in Laser Material Processing

Zakrzewski

Jurewicz

Ćwikła

et al. 2020

Sensors

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Imaging scatterometry is a method for determining the reflection distribution based on bidirectional reflectance distribution function (BRDF) measurements. However, it has a well-known limitation that results obtained by imaging scatterometry for small illumination angles are practically useless. Therefore, we propose an approach for reconstruction of the reflection distribution based on a series of measurements at different illumination angles and extrapolation of the missing results to overcome this limitation. The developed algorithm was validated using bidirectional transmittance distribution function (BTDF) measurements. The BRDF measurements were carried out for materials that are commonly used in laser material processing, i.e. substrates and functional coatings. The obtained data were subsequently used to determine the total reflection intensity from all considered materials, which were characterized by reconstructed distributions.

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“…The optical approaches would be much better if they are unaffected by some environmental factors such as surface cover or light intensity. In this manuscript, unlike the present stylus or optical methods for surface topography inspections of materials [19][20][21][22][23][24][25][26][27], a new electromagnetic NDT&E methodology is provided on the basis of the accurate magnetic representation of surface topography. Corresponding relationships between wave features and surface topography are presented and the relevant evaluation system for testing surface topography (concave, bumped, and flat features) is built.…”

Section: Introductionmentioning

confidence: 99%

A NDT&E Methodology Based on Magnetic Representation for Surface Topography of Ferromagnetic Materials

Sun¹,

Liu²

2016

Non-Destructive Testing

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Accurate evaluation is the final aim of nondestructive testing (NDT). However, the present electromagnetic NDT methods are commonly used to check the existence of defects, and all the tested targets only consist of concave defects (i.e., section-loss defects), such as holes, cracks, or corrosions, failing to evaluate the tested surface topography, which mainly consists of concave-shaped and bump-shaped features. At present, it is accepted that the commonly observed signals of the defects mainly manifest themselves in a single-/doublepeak wave and their up/down directions of the peak wave can be easily changed just by changing the directions of either applied magnetization or pick-up units even for one defect. Unlike the present stylus and optical methods for surface topography inspections, a new electromagnetic NDT and evaluation (NDT&E) methodology is provided based on the accurate magnetic representation of surface topography, in which a concaveshaped feature produces "positive" magnetic flux leakages (MFLs) and therefore forms a "raised" signal wave but a bump-shaped feature generates "negative" magnetic fields and therefore leads to a "sunken" signal wave. In this case, the corresponding relationships between wave features and surface topography are presented and the relevant evaluation system for testing surface topography (concave, bumped, and flat features) is built. The provided methodology was analyzed and verified by finite element and experimental methods. Meanwhile, the different dimension parameters of height/ depth and width of surface topography are further studied.

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New Scatterometer for Spatial Distribution Measurements of Light Scattering from Materials

Cited by 8 publications

References 4 publications

Signal Detection of Multi-Channel Capillary Electrophoresis Chip Based on CCD

Signal Detection of Multi-Channel Capillary Electrophoresis Chip Based on CCD

Imaging Scatterometry with Extrapolation of Missing BRDF Data for Materials Used in Laser Material Processing

A NDT&E Methodology Based on Magnetic Representation for Surface Topography of Ferromagnetic Materials

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