2006
DOI: 10.1007/s10762-006-9063-1
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New Scanning Millimeter Waveband Esr-Microscope With Localized Magnetic Field

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Cited by 5 publications
(3 citation statements)
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“…2, the values of SF component lie sufficiently above B r ¼ 4pM r for all points across the gap. The characteristic feature of this dependence is that the strong field is connected only with SF component H Z normal to the charged surface, but not with its tangential component as in system we studied before [4][5][6][7][8][9]. Note that strong field in Halbach cylinder [4] is connected with tangential component.…”
Section: Systems Of Magnets Generating Strong Uniform Fieldsmentioning
confidence: 91%
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“…2, the values of SF component lie sufficiently above B r ¼ 4pM r for all points across the gap. The characteristic feature of this dependence is that the strong field is connected only with SF component H Z normal to the charged surface, but not with its tangential component as in system we studied before [4][5][6][7][8][9]. Note that strong field in Halbach cylinder [4] is connected with tangential component.…”
Section: Systems Of Magnets Generating Strong Uniform Fieldsmentioning
confidence: 91%
“…To characterize such inhomogeneous field, we use the introduced above integral characteristic-the average field /HS. The value of average component /H Z (r, j)S above the surface of the magnet consisting of four sectors was calculated with the help of formula (9) and it equals to /H Z SE10M r , while in a narrow gap in the system composed of pair of such magnets the field equals correspondingly to /H Z SE20M r . If both magnets of the pair consist not of four but of eight elements (Fig.…”
Section: Quasi-nonuniform Systems (Qnus)mentioning
confidence: 99%
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