Since planar stacking of the base pairs is necessary for p-electron overlap, the planar base-pair stacking must be confirmed in materials comprising DNA that are used for transport measurements. Otherwise, a variety of apparently contradictory results can occur, as reported.[11±16]
ExperimentalThe DNA macromolecules in films of DNA complexed with CTMAB were aligned by tensile drawing. Calf DNA was purchased from Sigma; CTMAB was obtained from Aldrich. The preparation details of DNA±surfactant film and alignment are described elsewhere [19,20]. The samples designated as ÂȘdryÂș were dried in the air (relative humidity (RH) approx. 50 %) after tensile-drawing for at least 1 day. The samples designated ÂȘwetÂș were prepared by putting the aligned samples in water, hydrated to equilibrium, and then taken out and sealed in very thin Kapton bags (~15 lm thick) in which the RH is close to 100 %. The thin Kapton film contributes weakly to the background in the wide angle X-ray diffraction (WAXRD); that background contribution was subtracted from total diffraction signal.Small angle X-ray diffraction (SAXRD) data were obtained with a two-circle diffractometer equipped with a Rigaku, RU-300 rotating copper anode generator (50 kV and 40 mA) and a charge coupled device (CCD) detector. The WAXRD studies used a Siemens Smart diffractometer equipped with a normal focus, 2.4 kW sealed tube X-ray source (Mo Ka radiation, operating at 45 kV and 40 mA), and equipped with an Oxford Cryostream for low temperature experiments. Differential scanning calorimetry (TA DSC-2920) was used to characterize the low temperature thermal properties of the hydrated DNA±surfac-tant complex samples.