New mechanism of contact electromigration

Kim, Eung-Soo; Cho, Kyung-Won; Jang, Hyungwoo; Lim, Se-won

doi:10.1109/icsict.1995.499264

Proceedings of 4th International Conference on Solid-State and IC Technology

DOI: 10.1109/icsict.1995.499264

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New mechanism of contact electromigration

Eung-Soo Kim

Kyung-Won Cho

Hyungwoo Jang

et al.

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New mechanism of contact electromigration

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