New instrumentation for micro-imaging X-ray absorption spectroscopy using optical detection methods

Poolton, N.R.J.; Towlson, Brian; Hamilton, B.; Evans, D. A.

doi:10.1016/j.nimb.2006.01.013

Cited by 18 publications

(12 citation statements)

References 24 publications

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“…Alternatively, a relatively large area of sample may be illuminated simultaneously with a broad beam (a macroprobe), and the emission imaged onto a detector with lateral resolution, e.g. a pixelated detector such as a charge coupled device (CCD) [6,[14][15][16][17][18], sometimes with energy resolution on each pixel [19,20]. This is just applying the principle of the microscope.…”

Section: Introductionmentioning

confidence: 99%

XEOM 1 - A novel microscopy system for the chemical imaging of heritage metal surfaces

et al. 2015

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Background: We describe a novel microscopy system which can obtain chemical maps from the surfaces of heritage metals in air or a controlled environment. The microscope, x-ray excited optical microscope Mk 1 (XEOM 1), forms images from x-ray excited optical luminescence (XEOL) induced by illuminating a few square millimetres of the sample with monochromated x-rays (broad beam or macroprobe illumination). XEOL is a spectroscopy tool in its own right and can, under the right circumstances, also be a vehicle for x-ray absorption spectroscopy. This (usually) synchrotron based technique provides information on the chemical state and short-range atomic order of the top few microns of a surface. It is thus well suited to heritage metal corrosion studies and is complementary to synchrotron x-ray diffraction.Results: Imaging can be performed by scanning the sample under an x-ray microprobe. We show elsewhere that the power density needed for image acquisition on a reasonable time-scale is high enough to damage a patina and modify its chemistry. Although the damaged region may be invisible to the human eye, the data are characteristic of the damage and not the native chemistry of the surface. A macrobeam power density can be 4 orders of magnitude smaller than that for a microbeam and no surface modification was observed on test samples. Features of the instrument are demonstrated using copper test surfaces with a spatially varying patination to establish the ground work for the imaging of copper, cuprite, nantokite and atacamite/paratacamite and a first application from a bronze chain mail link. In parallel we have developed a suite of imaging software which can process XEOM image stacks to produce reduced data sets characteristic of various aspects of the surface chemical map. These include edge-shift (oxidation state) images and edge height (high contrast) images and spectra from user defined regions of interest. Conclusions: The technique can map the oxidation state of a surface from shifts in the absorption edge energy across columns of pixels in an image set, and map particular compounds from their characteristic XANES spectra. Optically filtered images give improved chemical selectivity and the data sets contain as yet untapped information sources.

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Section: Introductionmentioning

confidence: 99%

XEOM 1 - A novel microscopy system for the chemical imaging of heritage metal surfaces

et al. 2015

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“…Previously, we have applied optically detected X-ray absorption spectroscopy (ODXAS) (the use of X-ray excited optical luminescence (XEOL) to acquire X-ray absorption data) to copper corrosion [11,12]. ODXAS potentially allows surface-specific chemical mapping of corrosion phenomena in both gaseous and liquid environments using microprobe [15] and microscopy tools [16][17][18]. We have recently developed an X-ray-excited optical microscopy (XEOM) system [17] known as XEOM 1 that adds lateral resolution to ODXAS spectra.…”

Section: Introductionmentioning

confidence: 99%

Synthesis and surface characterization of a patterned cuprite sample: Preparatory step in the evaluation scheme of an X-ray-excited optical microscopy system

Sabbe

Dowsett

Keersmaecker

et al. 2015

Applied Surface Science

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“…There have been a number of previous successful XELM projects where the images have been obtained by scanning a μm or sub-μm beam, [1][2][3][4][5][6][7] or even using confocal techniques. 8,9 The emphasis of these instruments has been primarily to examine luminescent materials and to correlate the luminescence with complementary information obtained by High intensity x-rays from an electromagnet undulator are dispersed by a spherical grating monochromator and focused into an experimental end station by a Kirkpatrick-Baez mirror pair.…”

Section: Introductionmentioning

confidence: 99%

Elemental and magnetic sensitive imaging using x-ray excited luminescence microscopy

Rosenberg

Zohar

Keavney

et al. 2012

Review of Scientific Instruments

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We demonstrate the potential of x-ray excited luminescence microscopy for full-field elemental and magnetic sensitive imaging using a commercially available optical microscope, mounted on preexisting synchrotron radiation (SR) beamline end stations. The principal components of the instrument will be described. Bench top measurements indicate that a resolution of 1 μm or better is possible; this value was degraded in practice due to vibrations and/or drift in the end station and associated manipulator. X-ray energy dependent measurements performed on model solar cell materials and lithographically patterned magnetic thin film structures reveal clear elemental and magnetic signatures. The merits of the apparatus will be discussed in terms of conventional SR imaging techniques.

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New instrumentation for micro-imaging X-ray absorption spectroscopy using optical detection methods

Cited by 18 publications

References 24 publications

XEOM 1 - A novel microscopy system for the chemical imaging of heritage metal surfaces

XEOM 1 - A novel microscopy system for the chemical imaging of heritage metal surfaces

Synthesis and surface characterization of a patterned cuprite sample: Preparatory step in the evaluation scheme of an X-ray-excited optical microscopy system

Elemental and magnetic sensitive imaging using x-ray excited luminescence microscopy

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