2022
DOI: 10.1109/access.2022.3158958
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New Diagnostic Forensic Protocol for Damaged Secure Digital Memory Cards

Abstract: Over the past twenty years, Secure Digital memory cards have become the most popular digital storage media. Therefore, law enforcement agencies need to develop forensic techniques to enable recovery of data, especially from cards severely damaged by accidents, air crashes, terrorist attacks or deliberate attempts by criminals to destroy evidence. The paper discusses the non-invasive and invasive diagnostics available to legal forensic experts, with descriptions of the necessary equipment, including binocular m… Show more

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Cited by 4 publications
(2 citation statements)
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References 28 publications
(26 reference statements)
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“…These examinations encompass both internal and external evaluations aimed at scrutinizing the component's construction, packaging, and leads. External tests, such as low-power visual inspection (LPVI) [39], blacktop testing [40][41][42], microblast analysis [43][44][45], hermiticity testing [46][47][48], scanning electron microscopy (SEM) [49][50][51][52], and scanning acoustic microscopy (SAM) [53][54][55], focus on assessing the component's exterior characteristics. The method of low-power visual examination (LPVI) uses tools like microscopes, digital cameras, or infrared light sources to inspect essential markings on package-level electronics and identify indications of previously used or recycled items, including marks on the package or leftover solder on IC connectors.…”
Section: Physical Inspectionsmentioning
confidence: 99%
“…These examinations encompass both internal and external evaluations aimed at scrutinizing the component's construction, packaging, and leads. External tests, such as low-power visual inspection (LPVI) [39], blacktop testing [40][41][42], microblast analysis [43][44][45], hermiticity testing [46][47][48], scanning electron microscopy (SEM) [49][50][51][52], and scanning acoustic microscopy (SAM) [53][54][55], focus on assessing the component's exterior characteristics. The method of low-power visual examination (LPVI) uses tools like microscopes, digital cameras, or infrared light sources to inspect essential markings on package-level electronics and identify indications of previously used or recycled items, including marks on the package or leftover solder on IC connectors.…”
Section: Physical Inspectionsmentioning
confidence: 99%
“…However, the use of micro-SD poses a risk of data loss or damage due to malfunction. Another device used for measurement was developed with a humidity and temperature sensor mounted on the project board Wi-Fi module, but it could only be used on the surface of the soil [28].…”
Section: Introductionmentioning
confidence: 99%