2011
DOI: 10.1107/s0909049511001828
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New developments in fabrication of high-energy-resolution analyzers for inelastic X-ray spectroscopy

Abstract: In this work new improvements related to the fabrication of spherical bent analyzers for 1 meV energy-resolution inelastic X-ray scattering spectroscopy are presented. The new method includes the use of a two-dimensional bender to achieve the required radius of curvature for X-ray analyzers. The advantage of this method is the ability to monitor the focus during bending, which leads to higher-efficiency analyzers.

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Cited by 82 publications
(73 citation statements)
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“…Thirdly, the tails of the combined CDFDW spectral resolution function is two orders of magnitude steeper than the tails of the Lorentzian distribution with the same FWHM. It should be noted that the long Lorentzian tails (spectral contrast C M = 11), are typical for spectral resolution functions of all existing inelastic x-ray scattering (IXS) spectrometers [24][25][26][27]. For the Lorentzian tails to reach the level of the measured CDFDW resolution function, the width of the Lorentzian distribution would have to be reduced to 65 µeV.…”
Section: Cdfdw Spectral Resolution Functionmentioning
confidence: 99%
“…Thirdly, the tails of the combined CDFDW spectral resolution function is two orders of magnitude steeper than the tails of the Lorentzian distribution with the same FWHM. It should be noted that the long Lorentzian tails (spectral contrast C M = 11), are typical for spectral resolution functions of all existing inelastic x-ray scattering (IXS) spectrometers [24][25][26][27]. For the Lorentzian tails to reach the level of the measured CDFDW resolution function, the width of the Lorentzian distribution would have to be reduced to 65 µeV.…”
Section: Cdfdw Spectral Resolution Functionmentioning
confidence: 99%
“…The experiments were conducted at beamline 30-ID-C (HERIX [34,35]) at the Advanced Photon Source (APS). The highly monochromatic x-ray beam of incident energy E i ≃ 23.7 keV (λ = 0.5226Å) had an energy resolution ∆E i ∼ 1.0 meV (full width at half maximum), and was focused on the sample with a beam cross-section ∼ 35 × 15 µm (horizontal×vertical).…”
Section: Inelastic X-ray Scatteringmentioning
confidence: 99%
“…Data analysis was performed using the DAVE software suite 35 . Inelastic x-ray scattering measurements on a single crystal with lateral dimensions 0.3 mm and thickness 0.015 mm were carried out on the HERIX spectrometer 36,37 at Sector 30 of the Advanced Photon Source using 23.7 keV incident energy photons, with an energy resolution of 1.5 meV. The sample was taken from a large single crystal that exhibits a small outof-plane moment of 0.011 µ B /U 17 .…”
Section: A Experimentsmentioning
confidence: 99%