New design of transient-noise detection circuit with SCR device for system-level ESD protection

Abstract

A new SCR-based transient detection circuit for onchip protection design against system-level ESD-induced electrical transient disturbance is proposed and verified in silicon chip. The experimental results in a 0.18-μm CMOS process have confirmed that the new proposed detection circuit can successfully memorize the occurrence of system-level ESDinduced electrical transient events. The detection output can be cooperated with firmware operation to automatically execute system recovery procedure, therefore the immunity of microelectronic systems against system-level ESD test can be effectively improved.