2011
DOI: 10.17146/aij.2010.32
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New Analytical Methods for the Surface/ Interface and the Micro-Structures in Advanced Nanocomposite Materials by Synchrotron Radiation

Abstract: Analytical methods of surface/interface structure and micro-structure in advanced nanocomposite materials by using the synchrotron radiation are introduced. Recent results obtained by the energy-tunable and highly collimated brilliant X-rays, in-situ wide angle/small angle X-ray diffraction with high accuracy are reviewed. It is shown that small angle X-ray scattering is one of the best methods to characterize nanoparticle dispersibility, filler aggregate/agglomerate structures and in-situ observation of hiera… Show more

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Cited by 4 publications
(4 citation statements)
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“…The wavelength of X-ray was 0.100 nm, and the sample-to-detector distance was 1.3 m. The SAXS measurements were also conducted at BL08B2 in SPring-8 with an exposure time of 10 s by using PILATUS 100 K (DECTRIS Ltd., Baden, Switzerland). The wavelength of X-ray was 0.100 nm, and the sample-to-detector distance was 1.5 m. Refer to the publication in detail for BL40B2 and for BL08B2. , …”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The wavelength of X-ray was 0.100 nm, and the sample-to-detector distance was 1.3 m. The SAXS measurements were also conducted at BL08B2 in SPring-8 with an exposure time of 10 s by using PILATUS 100 K (DECTRIS Ltd., Baden, Switzerland). The wavelength of X-ray was 0.100 nm, and the sample-to-detector distance was 1.5 m. Refer to the publication in detail for BL40B2 and for BL08B2. , …”
Section: Methodsmentioning
confidence: 99%
“…The wavelength of X-ray was 0.100 nm, and the sample-to-detector distance was 1.5 m. Refer to the publication in detail for BL40B2 28 and for BL08B2. 29,30 DSC Measurements. DSC measurements were conducted for the thermally annealed SEBS-8 and SIBS films and for the as-cast film of SEBS-16 to evaluate T g of PS.…”
Section: ■ Experimental Sectionmentioning
confidence: 99%
“…A PILATUS 100K (DECTRIS) was used as a two-dimensional detector. The typical exposure time was 100 s. Further details of the SAXS apparatus are available in the literature . The 2d-SAXS patterns were converted to one-dimensional (1d-SAXS) profile by so-called circular average.…”
Section: Experimental Sectionmentioning
confidence: 99%
“…Nakamae等人 [52] 发展了利用同步辐射的先进纳米 复合材料表面/界面结构和微观结构的分析方法, 掠入 图 7 (网络版彩图)微孔洞萌生、连通及扩展过程 [40] Shimomura等人 [53] 通过原位X射线衍射(XRD)对 分子束外延过程中InAs量子点(QDs)和各种帽层的生 长进行直接测量. 基于在各种晶格常数下获得的XRD 强度瞬变来讨论在封盖期间在QD和盖层中诱导的应 变的演化.…”
Section: 卡儿分量以及全部九分量应变张量都能被实验表征unclassified