1997
DOI: 10.1016/s0921-4526(96)01221-5
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Neutron scattering in engineering applications

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Cited by 19 publications
(8 citation statements)
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“…Neutron strain scanning is already established as an excellent method for nondestructive 3D probing of stresses existing within bulk engineered components [8][9][10][11]. In this method, the crystal lattice is used as a built in sensor capable of detecting minor elastic distortions of the crystal lattice (changes of interplanar spacing) due to the effect of stress (Fig.…”
Section: Neutron Strain Scanning Methodsmentioning
confidence: 99%
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“…Neutron strain scanning is already established as an excellent method for nondestructive 3D probing of stresses existing within bulk engineered components [8][9][10][11]. In this method, the crystal lattice is used as a built in sensor capable of detecting minor elastic distortions of the crystal lattice (changes of interplanar spacing) due to the effect of stress (Fig.…”
Section: Neutron Strain Scanning Methodsmentioning
confidence: 99%
“…The direct calculation of stress from the piece-wise measured elastic strains using equations 2-5 is the common approach widespread in the literature [8][9][10][11]. Its main advantage is that the calculated stress state originates directly from the elastic strains measured in particular measurement points.…”
Section: Figure 15 Herementioning
confidence: 99%
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“…Often the determination of the residual stress state, rather than simply the residual strains is the objective. Generally, six independent strain directions are needed to calculate stress, however usually the principal stress directions are known, thus it is sufficient to measure strain along each of these directions [14]. For example, the stress in a principal direction X, is given by:…”
Section: Experimental Methodology and Materialsmentioning
confidence: 99%
“…[1][2][3] The analysis of neutron diffraction profiles can provide some useful microstructural parameters, such as a lattice strain, e hkl , and microscopic strain. 4) The determination of e hkl is based on the measurement of small angular displacements of diffraction peaks caused by small variations in lattice plane spacing, Dd hkl , in a sampled specimen with respect to the stressfree lattice plane spacing, d 0 hkl , (e hkl ϭDd hkl /d 0 hkl ).…”
Section: Introductionmentioning
confidence: 99%