2019
DOI: 10.1016/j.solmat.2018.10.004
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Neutron reflectometry and hard X-ray photoelectron spectroscopy study of the vertical segregation of PCBM in organic solar cells

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Cited by 7 publications
(2 citation statements)
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“…In general, the FOM is defined as the evaluation factor of the fitting, which is calculated by the average of the absolute difference between the logarithms of the data and simulation as where Y Q is the measured intensity and S Q is the simulated intensity for each Q -point, and N and p represent the number of experimental data points and the free parameters in the fit, respectively . Different from the NR fitting for the 0% DIO sample in our previous work, PBDB-T and ITIC are supposed to be distributed in a gradient concentration in the film depth direction; hence, a model with continuously varying SLD was used. The best fit for the corresponding data yields an FOM of 0.10.…”
Section: Resultsmentioning
confidence: 99%
“…In general, the FOM is defined as the evaluation factor of the fitting, which is calculated by the average of the absolute difference between the logarithms of the data and simulation as where Y Q is the measured intensity and S Q is the simulated intensity for each Q -point, and N and p represent the number of experimental data points and the free parameters in the fit, respectively . Different from the NR fitting for the 0% DIO sample in our previous work, PBDB-T and ITIC are supposed to be distributed in a gradient concentration in the film depth direction; hence, a model with continuously varying SLD was used. The best fit for the corresponding data yields an FOM of 0.10.…”
Section: Resultsmentioning
confidence: 99%
“…Organic solar cells (OPV) show tremendous potential due to their inexpensive and easy solution processing. Though raw materials are presently very expensive for commercialization, once economies of scale are reached this hurdle will dissipate. However, the low power conversion efficiency of OPV remains a big challenge. ,, To address these issues, new materials are being developed, including low band gap semiconducting polymers and small molecules. At the same time, efforts to understand the morphology of OPV in terms of processing and molecular structures is critical to designing molecules that improve their performance. Our work focuses on investigating the morphology of a semiconducting poly­(3-hexylthiophene) (P3HT) polymer under shear-flow.…”
Section: Introductionmentioning
confidence: 99%