2015
DOI: 10.1051/epjconf/201510401005
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Neutron reflectivity

Abstract: Abstract. The specular neutron reflectivity is a technique enabling the measurement of neutron scattering length density profile perpendicular to the plane of a surface or an interface, and thereby the profile of chemical composition. The characteristic sizes that are probed range from around 5 Å up 5000 Å. It is a scattering technique that averages information on the entire surface and it is therefore not possible to obtain information within the plane of the interface. The specific properties of neutrons (po… Show more

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Cited by 10 publications
(7 citation statements)
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“…Pure roughness (i.e., a sharp but geometrically nonflat transition between materials) and interdiffusion (nonsharp but flat transition region) are not distinguishable in specular reflectometry, thus also not in this study, and can both be described by the error function mentioned above (cf. ref ). The fitting procedure consisted of finding the numerical values of the thickness and roughness parameters that best explained the experimentally measured reflectivity, with the relative contribution of pure roughness and interdiffusion (if both are present) being unknown.…”
Section: Methodsmentioning
confidence: 99%
“…Pure roughness (i.e., a sharp but geometrically nonflat transition between materials) and interdiffusion (nonsharp but flat transition region) are not distinguishable in specular reflectometry, thus also not in this study, and can both be described by the error function mentioned above (cf. ref ). The fitting procedure consisted of finding the numerical values of the thickness and roughness parameters that best explained the experimentally measured reflectivity, with the relative contribution of pure roughness and interdiffusion (if both are present) being unknown.…”
Section: Methodsmentioning
confidence: 99%
“…Solid lines indicate the simulated reflectivity curves according to the bestmatching parameters of the common volume fraction profile model (see Materials and Methods). The relevant features in the D 2 O contrast are highlighted in the plot by dividing the experimental and simulated reflectivity curves by the Fresnel reflectivity R F of an ideal air-D 2 O interface (48). The reflectivity oscillations around 0.02 Å -1 <q z < 0.06 Å -1 in both neutron contrasts are mainly due to the SLD variations associated with the hydrated extended saccharide layers.…”
Section: Lps Layers At Air-water Interfacesmentioning
confidence: 99%
“…[48] but can be summarized by understanding that the higher scattering length density (SLD) provided by D 2 O versus H 2 O allows for greater accuracy in bulk water uptake, at the cost of more easily identifying water distribution within the film. [ 49,50 ] The NR measurements of a 30 nm electron‐beam patterned Nafion film (Figures S11 and S12, Supporting Information) were performed on the Platypus instrument [ 51 ] at the OPAL reactor at the Australian Nuclear Science and Technology Organisation (ANSTO). At ANSTO, water activity control was achieved using a modified Hiden Isochema XCS system.…”
Section: Resultsmentioning
confidence: 99%