Neutron imaging with bent perfect crystals. II. Practical multi-wafer approach

Abstract

In a previous paper , J. Appl. Cryst. 34, 343± 357], the phase-space analysis of neutron imaging by Bragg re¯ection from thick bent perfect crystals or multi-wafer assemblies resulted in the derivation of various imaging conditions. An array of new applications becomes possible, including dispersive and non-dispersive neutron imaging at a sub-millimetre spatial resolution. This paper outlines the experimental test results on nondispersive imaging with thick packets of silicon wafers. The experimental results are compared with Monte Carlo simulations.