“…These studies usually combine NDT and destructive testing methods, for example, LM and SEM observation of metallographic samples, particle-induced X-ray emission (PIXE) analysis, inductively coupled plasma (ICP) analysis, X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS) analysis [ 19 , 22 , 23 , 27 , 28 ]. Some possible NDT methods that can be applied for elemental bulk analysis of silver coins are the neutron activation analysis (NAA) and the prompt-gamma activation analysis (PGAA) [ 34 , 35 , 36 , 37 , 38 , 39 ]. Yet these methods have some limitations resulting from the high cross section for neutron capture by silver itself, and therefore the silver data would prevent revealing trace elements that could be useful fingerprint variations in the minting process.…”