Neurogenetic Design Centering

Pratap, R.J.; Sen, Padmanava; Davis, C.; Mukhophdhyay, R.; May, G.S.; Laskar, J.

doi:10.1109/tsm.2006.873517

Cited by 9 publications

(2 citation statements)

References 18 publications

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“…At technologies nodes of 90 nm and below, process variations pose a significant challenge to designers [2]. In the past, design centering has been used to improve the yield of RF systems [3]. However, this requires careful process monitoring and does not provide sufficient yield recovery under very large variability effects.…”

Section: Introductionmentioning

confidence: 99%

BIST-assisted power aware self healing RF circuits

Devarakond

Natarajan

Sen

et al. 2009

2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop

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In this paper, a novel methodology for post manufacture tuning of RF circuits is presented. The procedure uses an iterative test-tune-test algorithm that applies a compact alternative test to the DUT and modulates circuit level tuning knobs (bias/supply values) based on the DUT specification values predicted from the test. The test procedure is repeated until convergence to the desired spec values is achieved with minimal impact on circuit power consumption. A key benefit of this approach is that tuning of multiple specifications can be performed concurrently due to the use of the alternative test methodology allowing upto 10X savings in test/tuning time.

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Section: Introductionmentioning

confidence: 99%

BIST-assisted power aware self healing RF circuits

Devarakond

Natarajan

Sen

et al. 2009

2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop

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show abstract

“…In the design phase, design centering [5] is performed to maximize manufacturing yield in such a way that design parameters for a given circuit topology are optimized toward minimizing performance variability with respect to process, voltage, and temperature (PVT) variations. Such techniques are not IC-specific and are geared toward optimizing the yield statistics across large populations of manufactured die given manufacturing process statistics.…”

mentioning

confidence: 99%

DSP-Driven Self-Tuning of RF Circuits for Process-Induced Performance Variability

Han

Kim

Chatterjee

2010

IEEE Trans. VLSI Syst.

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In the deep-submicrometer design regime, RF circuits are expected to be increasingly susceptible to process variations, and thereby suffer from significant loss of parametric yield. To address this problem, a postmanufacture self-tuning technique that aims to compensate for multiparameter variations is presented. The proposed method incorporates a "response feature" detector and "hardware tuning knobs," designed into the RF circuit. The RF device test response to a specially crafted diagnostic test stimulus is logged via the built-in detector and embedded analog-to-digital converter. Analysis and prediction of the optimal tuning knob control values for performance compensation is performed using software running on the baseband DSP processor. As a result, the RF circuit performance can be diagnosed and tuned with minimal assistance from external test equipment. Multiple RF performance parameters can be adjusted simultaneously under tuning knob control. The proposed concepts are illustrated for an RF lownoise amplifier (LNA) design and can be applied to other RF circuits as well. A simulation case study and hardware measurements on a fabricated 1.9-GHz LNAs show significant parametric yield enhancement (up to 58%) across the critical RF performance specifications of interest.

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Artificial Intelligence in Semiconductor Manufacturing

May

Kim

Triplett

et al. 2007

Wiley Encyclopedia of Electrical and Electronics Engineering

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The sections in this article are Introduction Artificial Intelligence Tools Process Modeling Optimization Process Monitoring and Control Process Diagnosis Yield Modeling Conclusion

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Neurogenetic Design Centering

Cited by 9 publications

References 18 publications

BIST-assisted power aware self healing RF circuits

BIST-assisted power aware self healing RF circuits

DSP-Driven Self-Tuning of RF Circuits for Process-Induced Performance Variability

Artificial Intelligence in Semiconductor Manufacturing

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