Negative differential resistance in photoassisted field emission from Si nanowires

Abstract

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Proposal of Field-Emission Device Capped with an Insulator Film and Aspects of Expected Performance

“…26 Performance of devices having the conventional Spindt-type structure is enhanced by laser illumination. 27,28 As shown in Ref.,29 the conventional Spindt-type device has to face the risk of electromigration. In this sense, photoassisted emission may suppress the impact of electromigration.…”