Photoinduced discharge is a common experimental technique for studying photogeneration and carrier transport in photoconductors. Although the technique was first devised for discharge with strongly absorbed light and trap-free transport, its application to systems with bulk-generated carriers and/or trap-controlled transport is becoming more important. It is noted that in the latter case, a finite error can be introduced by using the existing formula for data analyses. This paper describes a generalized method of deducing electronic transport and photogeneration properties from photoinduced discharge characteristics.