Negative capacitance gate stack and Landau FET-based voltage amplifiers and circuits: Impact of ferroelectric thickness and domain variations

Singh, Khoirom Johnson; Acharya, Lomash Chandra; Bulusu, Anand; Dasgupta, Sudeb

doi:10.1016/j.mejo.2023.105981

Microelectronics Journal

2023

DOI: 10.1016/j.mejo.2023.105981

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Negative capacitance gate stack and Landau FET-based voltage amplifiers and circuits: Impact of ferroelectric thickness and domain variations

Khoirom Johnson Singh,

Lomash Chandra Acharya,

Anand Bulusu

et al.

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Negative capacitance gate stack and Landau FET-based voltage amplifiers and circuits: Impact of ferroelectric thickness and domain variations

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References 33 publications

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