Near-Simultaneous Core- and Low-Loss EELS Spectrum-Imaging in the STEM using a Fast Beam Switch.

Thomas, Philippe; Scott, J.; Mackenzie, Mhairi; McFadzean, S.; Wilbrink, J; Craven, A. J.

doi:10.1017/s1431927606065512

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2006

Publication Types

Select...

Article1

Book1

Relationship

Self Cite0

Independent2

Authors

Journals

Cited by 2 publications

(1 citation statement)

References 2 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Mounted on one of the 35 mm camera ports is a retractable fast beam switch (FBS). The FBS allows us to collect the EELS core and low-loss spectra from the same regions under the same electron-optical conditions and hence to remove the effects of plural scattering and normalize the overall signal level [4]. Spectrum imaging is performed using Gatan DigiScan and Digital Micrograph software.…”

mentioning

confidence: 99%