Near-Field Resonance Microwave Tomography and Holography

Gaikovich, K. P.; Смирнов, А. И.; Yanin, D. V.

doi:10.1007/s11141-018-9842-2

Cited by 3 publications

(1 citation statement)

References 8 publications

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“…It is possible to further implement the MIM as a spatially-resolved readout instrument for memories with great resistivity changes [72]. MIM cannot detect small topographic changes with phases changes, but can directly measure local electronic properties and is more sensitive to operations [73][74][75][76]. The author demonstrates that the MIM can provide spatially resolved information when In 2 Se 3 nano-devices are phase-switched by voltage pulses [72].…”

Section: Electronic Inhomogeneitymentioning

confidence: 98%

Developments and Recent Progresses in Microwave Impedance Microscope

et al. 2020

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Microwave impedance microscope (MIM) is a near-field microwave technology which has low emission energy and can detect samples without any damages. It has numerous advantages, which can appreciably suppress the common-mode signal as the sensing probe separates from the excitation electrode, and it is an effective device to represent electrical properties with high spatial resolution. This article reviews the major theories of MIM in detail which involve basic principles and instrument configuration. Besides, this paper summarizes the improvement of MIM properties, and its cutting-edge applications in quantitative measurements of nanoscale permittivity and conductivity, capacitance variation, and electronic inhomogeneity. The relevant implementations in recent literature and prospects of MIM based on the current requirements are discussed. Limitations and advantages of MIM are also highlighted and surveyed to raise awareness for more research into the existing near-field microwave microscopy. This review on the ongoing progress and future perspectives of MIM technology aims to provide a reference for the electronic and microwave measurement community.

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Section: Electronic Inhomogeneitymentioning

confidence: 98%

Developments and Recent Progresses in Microwave Impedance Microscope

et al. 2020

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Developments and Recent Progresses in Microwave Impedance Microscope

Chen

Guo

Zhong

2020

J. Phys.: Conf. Ser.

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Microwave impedance microscope (MIM) is a near-field microwave technology which has low emission energy and can detect samples without any damages. It has numerous advantages, which can significantly suppress the common-mode signal as the sensing probe separates from the excitation electrode, and it is a powerful tool to characterize electrical properties with high spatial resolution. This article reviews the major theories of MIM in detail which involve basic principles and instrument configuration. Besides, this paper summarizes the improvement of MIM properties, and its cutting-edge applications in quantitative measurements of nanoscale permittivity and conductivity, capacitance variation and electronic inhomogeneity. The relevant implementations in recent literature and prospects of MIM based on the current requirements are discussed. Limitations and advantages of MIM are also highlighted and surveyed to raise awareness for more research into the existing near-field microwave microscopy. This review on the ongoing progress and future perspectives of MIM technology aims to provide reference for the electronic and microwave measurement community.

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Methods of near-field subsurface diagnostics: Theory, study, comparison

Gaikovich

2017

2017 19th International Conference on Transparent Optical Networks (ICTON)

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Near-Field Resonance Microwave Tomography and Holography

Cited by 3 publications

References 8 publications

Developments and Recent Progresses in Microwave Impedance Microscope

Developments and Recent Progresses in Microwave Impedance Microscope

Developments and Recent Progresses in Microwave Impedance Microscope

Methods of near-field subsurface diagnostics: Theory, study, comparison

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