Near-field effect in composite nanomaterials with a quasi-zero refractive index

Gadomsky, O. N.; Altunin, K. K.; Степин, С Н; Катнов, В Е; Rusin, A. A.; Pereskokov, E. A.

doi:10.1016/j.optcom.2013.11.035

Cited by 13 publications

(1 citation statement)

References 26 publications

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“…These fluctuations can be determined using the structure factor in the calculation of the lattice sums. A formula for the complex refractive index of the optical sphere with inclusions with allowance for the structural factor was derived in [19]. On the basis of this formula, in the particular case of M. Garnett transferring to the well-known formula [20], it was shown that the refractive index of the medium can reach zero and close to zero refractive indices in a wide range of wavelengths.…”

Section: Photon Localization In Optical Metamaterials With a Random Cmentioning

confidence: 99%

Localization of Photons in the Optical Metamaterial With Random Close to Zero Reflection Indicator

Gadomsky¹,

Ушаков²,

Gadomskaya³

2019

RENSIT

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The results of a theoretical and experimental study of the effect of photon localization in the composite layer of a nanomaterial (PMMA & Ag) with spherical silver nanoparticles are presented. Composite nanomaterial was a metamaterial with a random refractive index close to zero. The photon localization effect considered in this article is fundamentally different from the transverse localization of electromagnetic waves in 2D periodic structures, since it is considered in homogeneous transparent media far from the resonance of their structural elements. It is theoretically shown that at a vacuum-optical medium interface with a random refractive index close to zero the refraction of the wave occurs not according to Snell's law, but with the localization of photons, when the external plane wave is extinguished at a point. In accordance with the uncertainty relation photons propagate in the medium in all directions determined by a random angle of refraction. A condition under which the values of the angles of refraction of waves in a layer become complex quantities is derived. As a result, a parallel beam of light inside the layer is localized in a small region. A 1 mW helium-neon laser with longitudinal polarization of light and a wavelength of 632 nm has been used in experiment. The diameter of the laser beam was 1 mm. The radiation passing through the sample with a thickness of 10 μm in the longitudinal and transverse directions was recorded using a CD camera. When the sample is irradiated a photon localization region is formed in the composite layer, whose linear dimensions (8 μm) are comparable with the layer thickness. Keywords: optical metamaterial with randomly close to zero refractive index, polymer composite nanomaterial, silver nanoparticles, polymethyl methacrylate, photon localization in the composite layer UDC 546.722+546.271 Bibliography-24 references

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Section: Photon Localization In Optical Metamaterials With a Random Cmentioning

confidence: 99%

Localization of Photons in the Optical Metamaterial With Random Close to Zero Reflection Indicator

Gadomsky¹,

Ушаков²,

Gadomskaya³

2019

RENSIT

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Complex Refractive Index Extraction for Ultrathin Molybdenum Oxides Using Micro‐Photonic Integrated Circuit Chips

Hu,

Ma,

Zhang

et al. 2023

Advanced Optical Materials

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The emerging 2D nanomaterials with unique optical properties are promising for next‐generation miniatured on‐chip devices. One of the prerequisites is to precisely measure their optical parameters during their implementation. However, the inherent features of 2D layers, including limited lateral dimensions and ultra‐small thicknesses, are not favorable to the conventional characterization techniques applied in the bulk system, especially for optical complex refractive indices measurement. Here, this work proposes a silicon photonics‐enabled platform to evaluate the complex refractive indices of ultrathin 2D materials in a facile and reliable manner. Ultrathin molybdenum oxides (MoOx) with multiple stoichiometric states are selected as the target 2D material to provide sufficient complexity of the system for investigation. Upon the integration of ultrathin MoOx, the silicon photonic chip, in the form of a Mach‐Zehnder interferometer, exhibits wavelength shifts which are used for calculating the optical complex refractive indices. Compared with the theoretical calculation, the deviation is as low as 1% and generally less than 5%. This work demonstrates a highly accurate and reliable approach for measuring the complex refractive index of 2D films, possibly assisting future advances in 2D materials‐enabled optical and photonic applications.

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