Near-field differential scanning optical microscope with atomic force regulation

Abstract

We present the design and describe the operation of a scanning probe microscope which simultaneously provides the attractive mode force and near-field optical images of objects. In this technique, the force signal is used to track the topography, thus allowing the optical signal primarily to show variations in transmissivity. A number of results are presented on the application of the technique to imaging different samples.

Directional shear force microscopy

“…Thus, to measure friction as a function of angle, a cumbersome sample rotation procedure is required. An alternate method for detecting shear forces was introduced with optical fiber-based near field scanning optical microscopes, 7,8 which required a sensitive feedback signal for distance regulation. The shear forces experienced at the tip of the laterally oscillating fiber have been shown to be an effective way to study fundamental aspects of friction.…”

Microscope à double détection : STOM-AFM, principe et résultats

“…Pour résoudre même partiellement ce problème, quelques groupes [4][5][6] ont récemment proposé des solutions visant à maintenir la distance objet-pointe constante en utilisant un paramètre annexe (force de friction ou de répulsion) pour assurer le contrôle de distance. [9] La simulation théorique a été effectuée en deux étapes (Fig.…”

“…[9] La simulation théorique a été effectuée en deux étapes (Fig. 3 Le résultat expérimental de l'approche en z est représenté sur la figure 5. Il confirme la pré-diction théorique.…”

Near-Field Spectroscopic Studies of Fluorescence Quenching by Charge Carriers

“…(7,5,9) This approach provides a highly sensitive mechanism for tip-sample control, and eliminates the need for the more cumbersome shear-force feedback mechanism in which an additional laser and photodiode are required. (5,10,11) …”