2014
DOI: 10.2172/1330926
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NDE Techniques Used in PARENT Open Round Robin Testing

Abstract: This report documents the nondestructive evaluation (NDE) techniques used in the open testing portion of the Program to Assess the Reliability of Emerging Nondestructive Techniques (PARENT), which is comprised of approximately 170 inspections performed on 19 test blocks by 23 teams from Japan, Europe, South Korea, and the USA. The teams examined dissimilar metal weld (DMW) and bottom-mounted instrumentation (BMI) test blocks. The goal of the open portion of PARENT is focused on evaluating the capability of nov… Show more

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Cited by 1 publication
(2 citation statements)
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“…This shows that the range of depth sensitivity depends on the frequency chosen, due to the different Rayleigh wavelengths. Figure 6a illustrates the ray path of the shear wave, showing the shadow region where direct reflections cannot reach the detection EMAT, and no signal is received at the expected arrival time [16]. The crack depth affects the duration of the shadow region, with the depth d related to the length of the region x by…”
Section: Calibration Of Surface Defect Detectionmentioning
confidence: 99%
See 1 more Smart Citation
“…This shows that the range of depth sensitivity depends on the frequency chosen, due to the different Rayleigh wavelengths. Figure 6a illustrates the ray path of the shear wave, showing the shadow region where direct reflections cannot reach the detection EMAT, and no signal is received at the expected arrival time [16]. The crack depth affects the duration of the shadow region, with the depth d related to the length of the region x by…”
Section: Calibration Of Surface Defect Detectionmentioning
confidence: 99%
“…Where only one side of the sample is accessible, standard inspection may use time of flight diffraction, or phased array techniques [14,15]. For a simple inspection procedure, a modified version of through-transmission using an angle beam probe can be used, where a wave is transmitted into a sample and the blocking of the wave by a far-side defect is imaged [16][17][18][19]. A line-focusing shear-vertical (SV) wave EMAT has recently been proposed for targeting small flaws positioned on the material back wall, using reflections from the defect back to the transducer [20,21].…”
Section: Introductionmentioning
confidence: 99%