2022
DOI: 10.1007/s00339-022-06258-6
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NbO2-based locally active memristors: from physical mechanisms to performance optimization

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Cited by 7 publications
(3 citation statements)
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“…Once the applied voltage is less than the hold voltage ( V Hold ), the device spontaneously switches back to the HRS. Due to the electron-related switching mechanism, the device exhibits a fast switching speed (~1 ns) 22 and high endurance (>10 10 cycles) 23 , which is decent for neuronal applications. According to the spike numbers within one cluster, the spiking and bursting features are two basic features that enable the neurons’ various firing behaviors.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Once the applied voltage is less than the hold voltage ( V Hold ), the device spontaneously switches back to the HRS. Due to the electron-related switching mechanism, the device exhibits a fast switching speed (~1 ns) 22 and high endurance (>10 10 cycles) 23 , which is decent for neuronal applications. According to the spike numbers within one cluster, the spiking and bursting features are two basic features that enable the neurons’ various firing behaviors.…”
Section: Resultsmentioning
confidence: 99%
“…Nevertheless, it is expensive to implement such a computation principle in conventional hardware platforms by simulating high-fidelity neurons, especially those with diverse firing behaviors that need rich dynamics [15][16][17][18] . Locally active memristors (LAMs), with rich dynamics [19][20][21] , low power consumption 22 and good scalability [23][24][25] , show intriguing potential to build Hodgkin-Huxley (H-H) neurons with excellent bio-plausibility [26][27][28][29] . However, current works typically focus on the emulation of neurons' firing behaviors, and the exhibition of firing features' computational capability remains an open question (see Supplementary Table 1).…”
mentioning
confidence: 99%
“…With increasing current flow, the Joule heating effect will be more significant and hence resulting in the broadening of the metallic filament [76]. There have been several reports on the Poole-Frenkel formula to describe the thermal runaway mechanism occurring in IMT devices, with the dependence being electric field and thermally driven [77][78][79]. The increase in the electric field will cause the filament temperature to increase.…”
Section: Negative Differential Resistance (Ndr) Phenomenonmentioning
confidence: 99%