Nanowear of gold and silver against silicon

In situ running-in wear assessment in multi-asperity nanotribology

“…Post mortem approaches might work for this purpose if the sample's contacting surfaces display a negligible elastic recovery as pure silver and gold, for instance [12]. Two complementary post mortem methods have then been chosen:…”

“…First, topographical assessment of the friction track at the end of the test makes sense because the stress-strain behavior of pure gold is known to be elastic-perfectly plastic [12]. Thus, z f % z r , as shown by the scar depicted in Fig.…”

“…Besides, nanowear mechanisms met in various microsystems are generally closer to the polishing process in terms of wear rate [9] than the classical mechanisms of abrasion [10], adhesion [7] or ploughing [4,11,12]. This peculiar wear process mainly results from the combination of a low contact pressure and a closed multi-asperity tribocontact that acts as a triboreactor at the micro/nanoscale [13][14][15][16][17], where thermal effects [18], chemical and physico-chemical interactions [19,1,20,21,7], environment's influence [14,[22][23][24]15,19,25], and tribolayer are likely to control the tribological behavior, as a selforganization process [26,27,15,16,18,17].…”

In situ accelerated micro-wear — A new technique to fill the measurement gap

“…Peng et al studied nano-wear of gold and silver against single silicon crystal using atomic force microscopy (AFM) to perform energy analysis for interfacial reactions [4]. Nanowear of Sn and Ni-Sn coatings, which can be potentially used for lithium ion battery anodes, was investigated by Chen et al using nanoindenter and multi-scratch technique [5].…”

A message from the publisher: Concepts in Magnetic Resonance to publish online only starting January 2011

“…We have recently reported a probe‐based nanofabrication technique—scanning probe alloying nanolithography (SPAN) (Peng et al 2010). Stress‐induced nanostructures can be fabricated through SPAN in noble metal and semiconductor materials system (Huitink et al 2009; Peng et al 2009). In this study, an enhanced SPM‐laser fabrication is investigated using a continuous wave laser integrated into an atomic force microscope (AFM).…”