1996
DOI: 10.1038/384147a0
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Nanotubes as nanoprobes in scanning probe microscopy

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Cited by 2,223 publications
(1,239 citation statements)
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References 25 publications
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“…To obtain better lateral resolution, carbon nanotubes are considered the preferred material for use as the probe tip of scanning probe microscopes on the basis of their large aspect ratio and good mechanical properties [43,44]. Even though SWCNTs are expected to provide good images including improved lateral resolution due to their small diameter (close to 1 nm), MWCNTs have provided better lateral images due to their good modulus [45,46].…”
Section: Atomic Force Microscopy Tipsmentioning
confidence: 99%
“…To obtain better lateral resolution, carbon nanotubes are considered the preferred material for use as the probe tip of scanning probe microscopes on the basis of their large aspect ratio and good mechanical properties [43,44]. Even though SWCNTs are expected to provide good images including improved lateral resolution due to their small diameter (close to 1 nm), MWCNTs have provided better lateral images due to their good modulus [45,46].…”
Section: Atomic Force Microscopy Tipsmentioning
confidence: 99%
“…Their shape allows them to probe crevices and image structures w x with large curvature gradients. Dai et al 24 were the first to recognize this potential. We have found that the electrical conductivity of such tips makes them useful not only for STM imaging but also in device fabrication.…”
Section: Carbon Nanotube Tips As Electrodes For Local Anodization Of mentioning
confidence: 99%
“…Indeed, the carbon nanotube would seem to be a natural material from which to make the tip of an AFM, as was first demonstrated in 1996 (ref. 1), five years after the first paper on nanotubes 2 and ten years after the first AFM, which used a shard of diamond as the tip 3 .…”
Section: Editorialmentioning
confidence: 99%