2002
DOI: 10.1007/s00216-002-1502-9
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Nanostructure and thermoelectric properties of ReSi 2±x thin films

Abstract: Anomalies in the nanostructure evolution of ReSi(2+/-x) thin films have proved to be of large interest in connection with their thermoelectric properties. By means of electron microscopic methods the correlation between structural properties and transport behaviour has been studied. The short-range order of the amorphous state was characterised by reduced density functions calculated from diffuse electron diffraction diagram and is found to correlate with the temperature dependence of the electrical resistance… Show more

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