2013
DOI: 10.1016/j.corsci.2012.11.003
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NanoSIMS investigation of passive oxide films on high-Cr cast iron

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Cited by 22 publications
(26 citation statements)
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“…Quantitative EMPA measurements determined that although the Cr content in the matrix distanced from the carbide/matrix boundaries remains at around 11.5-12.5 wt% (sufficient to form a chromium oxide-based passive film), in the vicinity of the boundaries it can drop to 9.5 wt% [37]. A more sensitive NanoSIMS technique has confirmed the EMPA results [37].…”
Section: High-resolution Surface Analysis Of 30crwcisupporting
confidence: 54%
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“…Quantitative EMPA measurements determined that although the Cr content in the matrix distanced from the carbide/matrix boundaries remains at around 11.5-12.5 wt% (sufficient to form a chromium oxide-based passive film), in the vicinity of the boundaries it can drop to 9.5 wt% [37]. A more sensitive NanoSIMS technique has confirmed the EMPA results [37].…”
Section: High-resolution Surface Analysis Of 30crwcisupporting
confidence: 54%
“…A more sensitive NanoSIMS technique has confirmed the EMPA results [37]. A novel approach to the SIMS method, which included a deposition of a thin layer of cesium prior to implanting primary ions, allowed the authors to resolve the discrete oxide sub-layers [37].…”
Section: High-resolution Surface Analysis Of 30crwcimentioning
confidence: 73%
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