Nanoscopic photodeposited structures analyzed by an evanescent optical method

Socol, G.; Axente, E.; Oane, Mihai; Voicu, Letitia; Petriş, A.; Vlad, V. I.; Mihăilescu, I. N.; Mirchin, N.; Margolin, R.; Naot, D.; Peled, A.

doi:10.1016/j.apsusc.2007.01.076

Cited by 12 publications

(21 citation statements)

References 8 publications

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“…The DELI technique developed [9,10] is an optical far field technique used for probing nanometer thickness profiles in the z-direction, i.e., into the depth of the surface samples. It uses the scattered evanescent optical light intensity pattern scattered from the deposited particles at the substrate/interface from a visible wide spectra light beam propagating through the glass substrate which serves also as light waveguide.…”

Section: Deli Results Of the Nanolayers Morphologymentioning

confidence: 99%

“…As discussed in Refs [9,10] we assume that evanescent fields generated by TIR in the waveguide are transformed by the deposited nanolayer into scattered outward propagating waves, which reach the CCD camera and are captured as images of varying light intensity. In our DELI phenomenological model, we assume that the evanescent field in the air close to the waveguide is perturbed and scattered by the deposited a-Se particles.…”

Section: Discussionmentioning

confidence: 99%

“…The thickness profile diagnostic DELI method [9,10] used here is an optical microscopy technique based on capturing the optical field extracted by the nano layer deposited on a waveguide from optical evanescent fields. This technique has the advantage over reflective or transmission microscopy that the propagating electromagnetic field in the waveguide does not interfere with the observed field extracted at the substrate/layer interface, thus giving an excellent dark background enabling sensitive nanometer thickness profiling.…”

mentioning

confidence: 99%

“…In this work we used the Maxwell equation solver FullWAVE [8] for simulating the scattering of light from the waveguide by a-Se particles and the results compared to the optical density profiles of nanometer thickness layers obtained by the experimental DELI [9,10] technique.…”

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confidence: 99%

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Differential evanescent light intensity imaging of nanothin films: simulation of the scattered field

Gankin

Popescu

Apter

et al. 2011

Phys. Status Solidi C

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The evanescent optical field scattering simulation of a‐Se nanoparticles was obtained by the Maxwell equation solver FullWAVE and correlated to experimental a‐Se films nanoprofiles obtained by Differential Evanescent Light Intensity Imaging (DELI). The DELI method was used as an experimental imaging method of depth profiles for large areas, i.e., hundreds of mm2 of nanometer thick a‐Se layers. The comparison of light scattering simulation and thickness profiles obtained from the experiments corresponds to an optical scattering mechanism leading to evanescent light extraction by the a‐Se nanoparticles. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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Section: Deli Results Of the Nanolayers Morphologymentioning

confidence: 99%

Section: Discussionmentioning

confidence: 99%

mentioning

confidence: 99%

mentioning

confidence: 99%

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Differential evanescent light intensity imaging of nanothin films: simulation of the scattered field

Gankin

Popescu

Apter

et al. 2011

Phys. Status Solidi C

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“…In this work we used the differential evanescent light intensity imaging (DELI) method developed previously [6,7] for imaging large areas (hundreds of mm 2 ) nanothin layers of polyethylene (PE) obtained by the Matrix Assisted Pulsed Laser Evaporation (MAPLE) technique [8] which is basically similar to Pulsed Laser Deposition (PLD) [9].…”

Section: Introductionmentioning

confidence: 99%

Estimation of polyethylene nanothin layer morphology by differential evanescent light intensity imaging

et al. 2010

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We investigated the morphology of polyethylene films by the Differential Evanescent Light Intensity (DELI) imaging method developed by us previously. The films were prepared by the Matrix Assisted Pulsed Laser Evaporation (MAPLE) technique. Rough or smooth organic layers were fabricated with thickness depending on the deposition conditions. We used the DELI imaging method here as a fast, low cost method for surface morphology diagnostics of large areas (i.e., hundreds of mm 2 ) of nano layer polyethylene films.

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