2004
DOI: 10.1103/physrevb.69.201402
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Nanoscale study of conduction through carbon nanotube networks

Abstract: We present local conductance measurements of carbon nanotube networks with nanometer scale resolution and show that there are discrete drops in conductance that correspond to junctions of metallic nanotubes and semiconducting nanotubes. The anomalies of these networks compared to thin films are shown, and a new method of discerning between semiconducting and metallic single-wall carbon nanotubes is demonstrated.

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Cited by 145 publications
(148 citation statements)
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“…An alternating voltage is applied in order to obtain spatially resolved information about the electrical capacitance, which depends on the number density of mobile electrons and holes. This method has also allowed to investigate the nanoscopic conduction pathways for electrons and holes in electroluminescent polymers [14], in metal-insulatornanocomposites [15] and in networks of nanotubes [16].…”
Section: Introductionmentioning
confidence: 99%
“…An alternating voltage is applied in order to obtain spatially resolved information about the electrical capacitance, which depends on the number density of mobile electrons and holes. This method has also allowed to investigate the nanoscopic conduction pathways for electrons and holes in electroluminescent polymers [14], in metal-insulatornanocomposites [15] and in networks of nanotubes [16].…”
Section: Introductionmentioning
confidence: 99%
“…14,15 Only the semiconducting tubes can have their conductance significantly modulated by the gate in an FET. The switching mechanism in CNTN-FETs can be due to modulation of the Schottky barriers between semiconducting tubes and metallic tubes [16][17][18] or metal contacts. 19 It could also be due to modulation of semiconducting tube conductance either by controlling the carrier density or by modulating Schottky barriers in semiconducting tubes formed by defects or overlaps with metallic tubes.…”
mentioning
confidence: 99%
“…To begin investigating the sources of resistance in different types of CNTN-FETs, we have employed EFM to create maps of where the voltage drops in the films when a current flows through them [29][30][31][32][33][34][35] (see Supporting Information for a description of the EFM technique). Our first images are of CVD grown films contacted by 40 µm wide Ti/Au source and drain electrodes with 40 µm spacing.…”
mentioning
confidence: 99%
“…Their potential applicability in building of carbon-based nanodevices has been demonstrated by the construction of rectifying diodes [1], field-effect transistors [2], or carbon nanotube conducting networks [3]. In some of these applications one has to connect two or more different carbon nanotubes.…”
Section: Introductionmentioning
confidence: 99%